Keyence Series

  • Keyence X150F/A CV-X150F CV-X150A
Keyence X150F/A CV-X150F CV-X150A

Keyence X150F/A CV-X150F CV-X150A

  • Product description: Keyence X150F/A CV-X150F CV-X150A_KEYENCE Sensor de Imagem/Controlador._liyuan tech
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Manufacturer : Keyence
Product No. : X150F/A CV-X150F CV-X150A
Series: Todos os CV-X séries disponíveis
Manufacturing date code: Latest date
Description: KEYENCE Sensor de Imagem/Controlador.
Packaging Details: Standard Carton Box Package
Unidades de venda: Single item
tamanho único pacote: 20X10X15 cm
peso bruto único: 1KG
Origin: Japan
The Keyence X150F/A is a standard model microscope in the VHX series of high-precision, wide-field microscopes from Keyence. It represents the pinnacle of optical microscopic imaging technology in the field of industrial inspection, 
designed specifically for applications requiring sub-micron accuracy and wide-field observation/measurement.
Product Core Description
1. Core Positioning:
Ultra-high precision optical microscope: Essentially an industrial-grade digital microscope system, but it integrates powerful optical design, image processing, measurement, and analysis functions. \
Non-contact 3D surface observation and measurement: Utilizing advanced optical technology and algorithms, achieve high-precision and high-repeatability 2D and 3D size measurement and surface topography analysis.
Perfect combination of "wide field of view" and "high resolution": The core advantage of the X150F/A model lies in its ability to provide extremely high optical resolution (typically up to 1.5 μm) within a relatively large field of view (FOV), 
without the need to frequently move the sample or replace the lens to complete high-resolution observation and precise measurement of a large area.
2. Model Explanation (X150F/A):
X150: Refers to the standard magnification range of this model microscope. X150 indicates that its optical zoom range typically covers lower to moderately high magnification (specific range such as 20x to 150x or similar,
 check the specific specification sheet),
Emphasizing that it has a very large field of view at medium and low magnification, while maintaining high resolution at high magnification. In contrast, there are X500 (higher magnification, smaller field of view), 
X2000 (highest magnification, smallest field of view) and others.
F: Represents Fixed Lens (fixed focal length lens). This is the most mainstream and user-friendly configuration in the VHX series.
Advantages: Extremely simple operation, no focusing required! Just place the sample on the stage (even if the sample has height differences), the system will automatically use the high-speed, 
high-precision depth-of-field synthesis technology to instantly generate a fully focused image with a clear field of view. This greatly improves detection efficiency and usability, especially suitable for uneven samples or batch testing.
A: Usually represents Standard Model (standard model). In the VHX series, the "A" suffix generally refers to the standard field of view range configuration at this magnification. 
Keyence may also offer models with a wider field of view at the same magnification (possibly represented by "W") or other special configurations.
3. Core technical features and advantages:
Unparalleled depth-of-field synthesis:
One of the core technologies. By quickly taking multiple photos of different focal planes, real-time synthesis of a single image with a clear entire field of view is achieved, 
even for complex surfaces with large height differences (such as threads, rough sections, IC pins) it can instantly present a perfect focus effect. Completely solving the pain point of traditional microscopes requiring repeated focusing.
Ultra-high resolution optical system:
Using high-quality compensatory chromatic aberration lenses and optimized optical design, combined with high-pixel CMOS sensors, 
provide resolution far exceeding that of ordinary industrial microscopes or ordinary telecentric lenses (up to 1.5 μm), capable of clearly observing and measuring extremely small details.
True seamless zooming:
During optical zooming, no need to switch objective lenses, the field of view changes continuously, the image remains clear and without position offset. 
Facilitates users to quickly find the appropriate observation magnification and perform associated measurements at different magnifications.
High-precision, high-efficiency 2D/3D measurement:
2D measurement: Provides a variety of measurement tools such as points, lines, circles, angles, areas, etc., with accuracy up to **sub-micron level (0.1 μm level). The automatic edge detection function is powerful and stable.
3D measurement: Utilizing its excellent depth-of-field information or specialized optical methods (such as shadow analysis), can construct a 3D topography map of the sample surface, 
for precise measurement of 3D parameters such as height difference, roughness, volume, cross-sectional shape, etc.
Outstanding imaging quality and observation mode:
Multi-angle observation and illumination system: Built-in ring LED illumination, can flexibly control the light source direction (coaxial light, oblique light, low-angle light, etc.), one-click switch, 
effectively highlighting different surface features (such as scratches, depressions, textures, foreign substances). 
Anti-glare/anti-reflective technology: Special algorithms can effectively suppress glare from high-reflective surfaces such as metals, presenting clear details.
High dynamic range imaging: Clearly presents areas with strong contrast between light and dark.
Powerful software and analysis functions (VHX software platform):
Interface is intuitive and easy to use, with extremely rich functions:
Automatic stitching: Easily create high-definition panoramic images with an ultra-wide field of view.
Automatic counting, area calculation.
Contour comparison: Compare the measured contour with CAD drawings or standard samples.
Surface defect detection and classification.
Surface roughness analysis (based on optical images).
Report generation automatically: Customizable report templates, including images, measurement data, annotations, etc.
Simple operation:
The non-focusing feature of the "F" model is a revolutionary simplification. Even beginners can quickly get started and perform high-precision inspections.
Flexibility:
Supports various bracket configurations (desktop, column, cantilever), suitable for samples of different sizes and shapes.
In addition to Keyence X150F/A CV-X150F CV-X150A ,Liyuan Tech supply a wide range of other Keyence Series .If you have any need or interest, please feel free to send inquiry to global@chn-liyuan.com